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Update Course in Diagnostic Radiology Physics: CT and MR Imaging—Assessment of Image Quality.

Time:

08:30 AM – 10:00 AM

Author:

Willi A. Kalender, PhD, Edward F. Jackson, PhD,  John M. Boone, Jiang Hsieh, and Jeffrey H. Siewerdsen

Code: RC232

Objective:

This session has three sections. The first is Image Quality Metrics, which informs attendees in regards to the activities of the ICRU committee on patient dose and image quality in . This section discusses proposed new methods for the assessment of spatial resolution in CT. It will demonstrate the use of the noise power spectrum (NPS) for the evaluation of contrast resolution in CT. This section shows and discusses the development of a new, inexpensive polyethylene phantom for CT image quality evaluation. The second section is Artifacts and Their Correction, which identifies common CT artifacts that often appear in routine clinical studies such as beam hardening, motion, cone beam, truncation, and metal, etc. Attendees will understand major sources of artifacts from both physics and clinical perspectives. This section discusses practical techniques to avoid or reduce these artifacts. It also illustrates techniques used in CT system designs to eliminate or minimize the impact of these artifacts. The third section is Image Quality in Flat-Panel-Detector CT, in which attendees will understand the basic principles, strengths, and limitations of flat-panel detector cone-beam CT. This section describes the scope of applications of flat-panel detector cone-beam CT, including preclinical imaging, diagnostic imaging, and Image-guided procedures. IT also identifies the fundamental physical factors that govern image quality in flat-panel detector cone-beam CT, including dose, geometry, x-ray scatter, image lag, and detector efficiency. Attendees will understand the metrics of imaging performance for flat-panel cone-beam CT, including contrast, noise, spatial resolution, efficiency, and spatial-frequency-dependent metrics of imaging performance. The section identifies the major source of artifacts and methods for artifacts management in flat-panel cone-beam CT.

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